1. Modeling and analysis of polarization effect on signal intensity profile of two-dimensional page data in holographic data storage system Itoh, Masahide, Shimada, Ken-ichi Optics Communications 486 126760 (2021)
2. High accuracy cross-sectional shape analysis by coherent soft x-ray diffraction Hoshino, Tetsuya, Saswatee, Banerjee, Aoki, Sadao, Sakurai, Kenji, Shiono, Masahiko, Itoh, Masahide Applied Optics 59 (28) 8661 - 8667 (2020)
3. Quasicrystal hole array as X-ray focusing optical element Hoshino, Tetsuya, Fukamizu, Takaaki, Aoki, Sadao, Itoh, Masahide Applied Physics Express 13 (10) 102004 (2020)
4. Cross-sectional particle measurement in the resonance domain on the substrate through scatterometry Tetsuya Hoshino, Norio Watanabe, Sadao Aoki, Kenji Sakurai, Masahide Itoh 25 (21) 26329 - 26348 (2017)
5. Efficient phase matching algorithm for measurements of ultrathin indium tin oxide film thickness in white light interferometry Kai Chen, Feng Lei, Masahide Itoh 24 (2) 121 - 127 (2017)
6. Efficient phase matching algorithm for measurements of ultrathin indium tin oxide film thickness in white light interferometry Masahide, Itoh, Kai, Chen, Feng, Lei Optical Review 24 (2) 121 - 127 (2017)
7. Simple and accurate optical height sensor for wafer inspection systems Kei Shimura, Naoya Nakai, Koichi Taniguchi, Masahide Itoh 23 (1) 1 - 9 (2016)
8. Measurement of ITO transparent electrode film thickness with white-light interferometer Kai Chen, Feng Lei, Masahide Itoh 8 (4) 567 - 573 (2015)
9. Imaging microscopy by phase-contrast engine: Retardation-Modulated differential interference contrast microscope Hiroshi Ishiwata, Masahide Itoh 9272 (2014)
10. Scatterometry of Slant Incidence to Isolated Scatterers for High-Density Memory Tetsuya Hoshino, Toyohiko Yatagai, Masahide Itoh 52 (9) (2013)

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