梅田享英 Umeda, Takahide | 筑波大学学者の杜

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収録対象は e-Rad で筑波大学に登録されている研究者、退職した研究者および連携大学院教員です。…続きを読む

論文 / Publication

Electron-spin-resonance and electrically detected-magnetic-resonance characterization on PbC center in various 4H-SiC(0001)/SiO2 interfaces T. Umeda, Y. Nakano, E. Higa, T. Okuda, T. Kimoto, T. Hosoi, H. Watanabe, M. Sometani, S. Harada 127 (14) 145301 - 145301 (2020)
Nearly degenerate ground state of phosphorus donor in diamond Umeda,Takahide PHYSICAL REVIEW MATERIALS 4 024603 (2020)
Carbon dangling-bond center (carbon Pb center) at 4H-SiC(0001)/SiO2 interface Umeda, T, Kobayashi, T, Sometani, M, Yano, Hiroshi, Matsushita, Y, Harada, S Appl. Phys. Lett. 116 (7) 071604-1 - 071604-5 (2020)
4H-SiC Si面・a面・m面界面欠陥の電流検出型電子スピン共鳴分光法による評価比嘉栄斗, 染谷満, 原田信介, 梅田享英, 矢野, 裕司先進パワー半導体分科会第6回講演会 67 - 68 (2019)
Electrically detected-magnetic-resonance identifications of defects at 4H-SiC(000-1)/ SiO2 interfaces with wet oxidation Umeda, Takahide, Kagoyama, Y, Tomita, K, Abe, Y, Sometani, M, Okamoto, M, Harada, S, Hatakeyama, T Applied Physics Letters 115 (15) 151602 (2019)
Electrically-detected-magnetic-resonance study on interface defects at a-face and m-face 4H-SiC/SiO2 interfaces Higa, Eito, Sometani, Mitsuru, Harada, Shinsuke, Yano, Hiroshi, Umeda, Takahide Abstract of International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) 116 (17) We-1A-06 (2019)
The PbC (carbon dangling bond) center at 4H-SiC(0001)/SiO2 interface: An EDMR study Umeda, Takahide, Kobayashi, Takuma, Matsushita, Yu-ichro, Higa, Eito, Yano, Hiroshi, Sometani, Mitsuru, Harada, Shinsuke Abstract of International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019) We-1A-02 (2019)
Formation of nitrogen-vacancy centers in 4H-SiC and their near infrared photoluminescence properties Shin Ichiro Sato, Takuma Narahara, Yuta Abe, Yasuto Hijikata, Takahide Umeda, Takeshi Ohshima 126 (8) (2019)
Electron Paramagnetic Resonance Study on 28Si Single Crystal for the Future Realization of the Kilogram Mizushima, Shigeki, Kuramoto, Naoki, Fujii, Kenichi, Umeda, Takahide IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 68 (6) 1879 - 1886 (2019)
Anomalous carbon clusters in 4H-SiC/SiO2 interfaces Kagoyama, Y, Okamoto, M, Yamasaki, T, Tajima, N, Nara, J, Ohno, T, Yano, H, Harada, S, Umeda, T JOURNAL OF APPLIED PHYSICS 125 (6) 065302-1 - 065302-8 (2019)