上殿 明良 / Uedono, Akira
数理物質系 教授 / Professor, Faculty of Pure and Applied Sciences
関連記事 / Related Articles in COTRE
論文 / Publication
- Hole capture-coefficient of intrinsic nonradiative recombination centers that commonly exist in bulk, epitaxial, and proton-irradiated ZnO S. F. Chichibu, A. Uedono, K. Kojima, K. Koike, M. Yano, S. Gonda, S. Ishibashi 127 (215704) 1 - 6 (2020)
- Origin and dynamic properties of major intrinsic nonradiative recombination centers in wide bandgap nitride semiconductors Shigefusa F. Chichibu, Kohei Shima, Kazunobu Kojima, Shoji Ishibashi, Akira Uedono 11280 (112800B) 112800B-1 - 10 (2020)
- Control of vacancy-type defects in Mg implanted GaN studied by positron annihilation spectroscopy Akira Uedono, Marcel Dickmann, Werner Egger, Christoph Hugenschmidt, Shoji Ishibashi, Shigefusa F. Chichibu Proceedings of SPIE 11280 (112800C) 11280C-1 - 8 (2020)
- The Influence of AlN Nucleation Layer on Radio Frequency Transmission Loss of AlN-on-Si Heterostructure Chang, S., Zhao, M., Spampinato, V., Franquet, A., Do, T.-H., Uedono, A., Luong, T.T., Wang, T.-H., Chang, L. (2020)
- Selective trapping of positrons by Ag nanolayers in a V/Ag multilayer system Qi, N., Zhang, H.X., Chen, Z.Q., Ren, F., Zhao, B., Jiang, M., Uedono, A. 10 (3) (2020)
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Annealing behaviours of open spaces in thin Al
2 O3 films deposited on semiconductors studied using monoenergetic positron beams Uedono, A., Egger, W., Koschine, T., Hugenschmidt, C., Dickmann, M., Ishibashi, S. 137 (2) (2020) -
Calculation of positron states and annihilation parameters in gamma and amorphous Al
2 O3 Ishibashi, S., Uedono, A. 137 (2) (2020) - Pore structure analysis of ionic liquid-templated porous silica using positron annihilation lifetime spectroscopy Sagara, A., Yabe, H., Chen, X., Vereecken, P.M., Uedono, A. 295 (2020)
- Free volume in epoxy resins for CFRP studied by means of positron annihilation Uedono, A. 86 (3) (2020)
- Effect of free-volume holes on static mechanical properties of epoxy resins studied by positron annihilation and PVT experiments Zhang, H.J., Sellaiyan, S., Sako, K., Uedono, A., Taniguchi, Y., Hayashi, K. 190 (2020)
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