櫻井 岳暁 / SAKURAI, TAKEAKI
数理物質系 准教授 / Associate Professor, Faculty of Pure and Applied Sciences
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論文 / Publication
- Study of defects in diamond Schottky barrier diode by photocurrent spectroscopy Guo, Junjie, Traore, Aboulaye, Bin Abu Bakar, Muhammad Hafiz, Makino, Toshiharu, Yamasaki, Satoshi, Ogura, Masahiko, SAKURAI, TAKEAKI Japanese Journal of Applied Physics 59 (SG) SGGK14 (2020)
- Study of defects in diamond Schottky barrier diode by photocurrent spectroscopy Guo, Junjie, Traore, Aboulaye, Bin Abu Bakar, Muhammad Hafiz, Makino, Toshiharu, Yamasaki, Satoshi, Ogura, Masahiko, SAKURAI, TAKEAKI Japanese Journal of Applied Physics 59 (SG) SGGK14 (2020)
- Photocarrier Recombination Dynamics in BiVO4 for Visible Light-Driven Water Oxidation Abdellaoui, Imane, Islam, Muhammad Monirul, Remeika, Mikas, Higuchi, Yui, Kawaguchi, Takato, Harada, Takashi, Budich, Christian, Maeda, Tsuyoshi, Wada, Takahiro, Ikeda, Shigeru, Takeaki, Sakurai The Journal of Physical Chemistry C 124 (7) 3962 - 3972 (2020)
- Photocarrier Recombination Dynamics in BiVO4 for Visible Light-Driven Water Oxidation Abdellaoui, Imane, Islam, Muhammad Monirul, Remeika, Mikas, Higuchi, Yui, Kawaguchi, Takato, Harada, Takashi, Budich, Christian, Maeda, Tsuyoshi, Wada, Takahiro, Ikeda, Shigeru, Takeaki, Sakurai The Journal of Physical Chemistry C 124 (7) 3962 - 3972 (2020)
- Fabrication of Mg2Sn(111) film by molecular beam epitaxy Aizawa, Takashi, Ohkubo, Isao, Lima, Mariana S. L, 櫻井, 岳暁, Mori, Takao Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 37 (6) 061513 (2019)
- Fabrication of Mg2Sn(111) film by molecular beam epitaxy Aizawa, Takashi, Ohkubo, Isao, Lima, Mariana S. L, 櫻井, 岳暁, Mori, Takao Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 37 (6) 061513 (2019)
- Influence of the Annealing Temperature on ALD-Al2O3/NAOS/Si MOS Interface Properties Fu, Wei, Zhang, Xufang, Umishio, Hiroshi, Traore, Aboulaye, Yano, Hiroshi, Sakurai, Takeaki Technical Digest of The 29th International Confrence on Photovoltaic Sciene and Enginnering (PVSEC-29) 1708 - 1710 (2019)
- The effect of biaxial stress on the carrier-transport properties at SiO2/4H-SiC interfaces Fu, W, Ueda, A, Yano, Hiroshi, Harada, S, Sakurai, T Extended Abstracts of 2019 International Conference on Solid State Devices and Materials (SSDM2019) 735 - 736 (2019)
- Effect of annealing temperature on Al2O3/NAOS/Si MOS interface properties Wei, Fu, Xufang, Zhang, Hiroshi, Umishio, Aboulaye, Traore, 矢野, 裕司, Takeaki, Sakurai 第80回応用物理学会秋季学術講演会 講演予稿集 13-228 (2019)
- Investigation of stress at SiO2/4H-SiC interface induced by thermal oxidation by confocal Raman microscopy Wei Fu, Ai Kobayashi, Hiroshi Yano, Akiko Ueda, Shinsuke Harada, Takeaki Sakurai 58 (SB) SBBD03 - SBBD03 (2019)
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